Structural characterization of surfaces by extended energy-loss fine-structure spectroscopy

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Abstract
We present recent structural investigations by extended energy-loss fine-structure (EELFS) measurements. The EELFS technique relies on the detection of the fine-structure losses above a core edge in the reflection mode. We demonstrate the possibility of extracting the radial distribution F(R) around each investigated atom. This is obtained by applying to the experimental EELFS data the Fourier transformation and the theoretical analysis used for extended x-ray absorption fine structure (EXAFS) spectroscopy. The aim of this paper is to answer the principal questions addressed by the EELFS technique in the last few years (dipole approximation, phase shift, backscattering amplitude transferability, and quantitative structural parameters, etc.). This is obtained by a systematic investigation on different elements around different core levels and by comparing our experimental spectra with EXAFS spectra. Technological application of the surface-EELFS technique for interface formation studies and clusters lattice parameter determination will be presented and discussed.

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