Precision Multiple-Beam Interference Fringes with High Lateral Microscopic Resolution
- 1 October 1955
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 45 (10) , 792-794
- https://doi.org/10.1364/josa.45.000792
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 2 references indexed in Scilit:
- Application of the Two-Beam Interference Microscope to the Study of SurfacesJournal of the Optical Society of America, 1954
- Use of Multilayer Films for Surface Topography InterferometryJournal of the Optical Society of America, 1954