Surface composition and chemical bonding of thermally reduced yttria as studied by XPS and SEXAFS: Influence of Zr doping
- 1 June 1990
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 15 (6) , 355-363
- https://doi.org/10.1002/sia.740150603
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Charge transfer and core-hole screening in PbTePhysical Review B, 1989
- EXAFS Study of Yttria‐Stabilized ZirconiaJournal of the American Ceramic Society, 1986
- Ionicity of metallic oxide surfaces on metals as observed by Auger (XPS) spectroscopySurface and Interface Analysis, 1985
- Auger and photoelectron contributions to the electron-yield surface extended x-ray-absorption fine-structure signalPhysical Review B, 1984
- The correlation of the auger parameter with refractive index: An XPS study of silicates using Zr Lα radiationSurface and Interface Analysis, 1982
- Use of the oxygen KLL Auger lines in identification of surface chemical states by electron spectroscopy for chemical analysisAnalytical Chemistry, 1980
- Ab initio calculations of amplitude and phase functions for extended x-ray absorption fine structure spectroscopyJournal of the American Chemical Society, 1979
- A new approach to identifying chemical states, comprising combined use of Auger and photoelectron linesJournal of Electron Spectroscopy and Related Phenomena, 1977
- Auger parameter in electron spectroscopy for the identification of chemical speciesAnalytical Chemistry, 1975
- Binding Energies and Chemical Shifts in ESCAPhysica Scripta, 1974