Study of microstructure and anomalous variation of resistivity in metal-C60 multilayer thin films
- 30 September 1992
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 83 (11) , 853-855
- https://doi.org/10.1016/0038-1098(92)90899-k
Abstract
No abstract availableKeywords
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