Weak Mutation Testing and Completeness of Test Sets
- 1 July 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Software Engineering
- Vol. SE-8 (4) , 371-379
- https://doi.org/10.1109/tse.1982.235571
Abstract
Different approaches to the generation of test data are described. Error-based approaches depend on the definition of classes of commonly occurring program errors. They generate tests which are specifically designed to determine if particular classes of errors occur in a program. An error-based method called weak mutation testing is described. In this method, tests are constructed which are guaranteed to force program statements which contain certain classes of errors to act incorrectly during the execution of the program over those tests. The method is systematic, and a tool can be built to help the user apply the method. It is extensible in the sense that it can be extended to cover additional classes of errors. Its relationship to other software testing methods is discussed. Examples are included.Keywords
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