Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells

This publication has 19 references indexed in Scilit:

• High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy
  Applied Physics Letters, 1999
• Progress toward 20% efficiency in Cu(In,Ga)Se2 polycrystalline thin-film solar cells
  Progress In Photovoltaics, 1999
• High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope
  Applied Physics Letters, 1998
• Status and prospects for CIS-based photovoltaics
  Solar Energy Materials and Solar Cells, 1997
• Vacuum compatible high-sensitive Kelvin probe force microscopy
  Review of Scientific Instruments, 1996
• Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy
  Applied Physics Letters, 1995
• Photovoltaik
  Published by Springer Nature ,1995
• High resolution atomic force microscopy potentiometry
  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
• Photovoltaic Cells
  Chemical & Engineering News, 1986
• ELECTRICAL PROPERTIES
  Published by Elsevier ,1975