Determination of Domain Wall Profiles in Magnetic Films

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Abstract
To determine the domain wall profile in a magnetic film from a defocused Lorentz micrograph, the electron intensity g(x) (which is inferred from the micrograph) must be translated into a curve of φ(ξ), where φ is the angle between the magnetization M and the wall normal and ξ is the position in the film plane measured from the wall center. To accomplish this task, classical and semiclassical ``inversion'' procedures which yield φ(ξ) from g(x) are presented. The validity of this approach is demonstrated by computer calculations on an artificial wall. An example of the inversion procedure applied to experimental data is given.

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