High Voltage Measurement by ADP Crystal Plate
- 1 May 1961
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 32 (5) , 595-597
- https://doi.org/10.1063/1.1717448
Abstract
High voltage measurement based on the electro‐optical effect of ADP crystal plate is described. When voltage is applied across a uniaxial ADP crystal, the crystal becomes biaxial. For the field EZ in the Z direction across a Z‐cut crystal plate, axes of the index ellipsoid are rotated by −45° in the XY plane independent of EZ and birefringence along the Z axis becomes proportional to EZ, then the retardation of light in the Z direction becomes proportional to applied voltage across the crystal plate. Therefore, the applied voltage can be obtained by photoelectric measurement of the optical retardation.This publication has 4 references indexed in Scilit:
- High Voltage Measurement by ADP Crystal PlateReview of Scientific Instruments, 1956
- A Narrow Passband Polarization Interference Filter for Hydrogen AlphaReview of Scientific Instruments, 1951
- The Electro-Optic Effect in Uniaxial Crystals of the Dihydrogen Phosphate Type*,† III Measurement of CoefficientsJournal of the Optical Society of America, 1950
- The Electro-Optic Effect in Uniaxial Crystals of the Type X H_2PO_4 I TheoreticalJournal of the Optical Society of America, 1949