Multiple-crystal x-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal
- 2 January 1995
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 66 (1) , 13-15
- https://doi.org/10.1063/1.114165
Abstract
A periodically domain‐inverted KTiOPO4 crystal has been characterized for the first time by multiple‐crystal multiple‐reflection x‐ray topography. The striation contrast within the domain‐ inverted regions has been revealed in high strain‐sensitivity reflection topographs. The origin of formation of the striation contrast and the mechanism of domain inversion in KTiOPO4 are discussed in terms of the structural characteristics of KTiOPO4.Keywords
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