Built-in dynamic current sensor circuitfor digital VLSI CMOS testing

29 September 1994

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 30 (20) , 1668-1669
https://doi.org/10.1049/el:19941168

Abstract

I_DDQ testing is a powerful strategy for detecting defects that do not alter the logic behaviour of CMOS ICs. Such a technique is very effective especially in the detection of bridging defects although some open defects can be also detected. However, an important set of open defects escapes quiescent power supply current testing because they prevent any current elevation. As a solution, dynamic current testing is investigated. A built-in dynamic current sensor is proposed.

Keywords

DIGITAL VLSI CMOS TESTING
BRIDGING DEFECTS
LOGIC BEHAVIOUR
BUILT-IN DYNAMIC CURRENT SENSOR CIRCUIT
DEFECT DETECTION
OPEN DEFECTS

This publication has 1 reference indexed in Scilit:

Electrical model of the floating gate defect in CMOS ICs: implications on I/sub DDQ/ testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1994