Principles of scanning electron microscopy at high specimen chamber pressures
- 1 January 1979
- Vol. 2 (2) , 72-82
- https://doi.org/10.1002/sca.4950020202
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Electron scattering by gas in the scanning electron microscopeJournal of Physics D: Applied Physics, 1979
- Charge neutralisation of insulating surfaces in the SEM by gas ionisationJournal of Physics D: Applied Physics, 1978
- The SEM examination of wet specimensScanning, 1978
- The elimination of charging artefacts in the scanning electron microscopeJournal of Physics E: Scientific Instruments, 1975
- A wet stage modification to a scanning electron microscopeJournal of Microscopy, 1975
- Scientific Foundations of Vacuum TechniquePhysics Today, 1949