A spinning-stage, total electron-yield detector for the elimination of diffraction peaks in x-ray absorption spectra

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Abstract
A primary problem in collecting and analyzing x-ray absorption fine structure (XAFS) from crystalline samples, including thin films grown on crystalline substrates, is the contamination of the x-ray absorption spectrum by diffraction events. To address this limitation, a total electron-yield detector equipped with a spinning stage was developed. Samples of (MnZn)Fe2O4, grown on single crystal (100) MgO substrates, were used to illustrate its effectiveness as an electron-yield detector and in eliminating diffraction-related contamination from the XAFS. The design and performance characteristics of this detector are presented and discussed.