Segmenting Dot Patterns by Voronoi Diagram Concavity

1 January 1983

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. PAMI-5 (1) , 104-110
https://doi.org/10.1109/tpami.1983.4767353

Abstract

This correspondence defines a signed distance, called ``internal concavity,'' on paths of the Voronoi diagram of a dot pattern. An algorithm using internal concavity to segment dot patterns is described. The segmentation algorithm produces subsets of the Dirichlet tessellation (Delaunay triangulation) of the dot pattern.

Keywords

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