A Study of X-ray Diffraction on the Cell Wall of a Stem Internode of Wheat Treated with Gibberellin

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Abstract
The first and second internodes of a variety of spring wheat (Konosu No. 25) were cultured on a medium containing gibberellin. The cell walls of such plants were studied by means of X-ray diffraction technique. In the X-ray diffraction diagrams from the control plants the cellulose micelles were oriented in two directions criss-crossing each other at an angle of about 45[degree] to the longitudinal axis of the stem. In contrast, diffraction diagrams of cellulose micelles from cell walls of gibberellin treated plants are oriented at random and accumulate membranous material in an amorphous state by the usual elongation of the cell walls.

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