Average Run Lengths in Cumulative Chart Quality Control Schemes
- 1 February 1961
- journal article
- research article
- Published by JSTOR in Technometrics
- Vol. 3 (1) , 11
- https://doi.org/10.2307/1266473
Abstract
Average run-lengths are evaluated for V-mask quality control schemes based on cumulative deviation charts when the observations are Normally distributed and either independent or members of a certain serially correlated class.Keywords
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