An improved double-tilt stage for the AEI EM7 high-voltage electron microscope
- 2 August 1982
- journal article
- research article
- Published by Wiley in Journal of Microscopy
- Vol. 127 (2) , 155-159
- https://doi.org/10.1111/j.1365-2818.1982.tb00408.x
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Side Entry Specimen StagesCrystal Research and Technology, 1979
- A tilting stage for electron microscopy of biological objectsJournal of Physics E: Scientific Instruments, 1970