Calculated And Measured Refractive Index Profiles Of K+-Exchanged Glass-Waveguides

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Abstract
K+-exchanged film and stripe waveguides have been fabricated. The diffusion time varied between one and 16 hours. m-line spectroscopy was used to characterize the waveguides. The refractive index profile of those waveguides is proportional to a concentration profile calculated under the assumption that the number of indiffused ions is limited by the glass network to a constant value at the surface. From those profiles derived n eff-values and near-fields compare well with the measurements in a wide range of strip widths and diffusion times. The waveguides can be described by four parameters: a constant ∆ N, the stripe width, the diffusion time and the diffusion coefficient.

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