High-resolution X-ray diffraction from microstructures
- 1 April 1997
- journal article
- research article
- Published by Taylor & Francis in Ferroelectrics
- Vol. 194 (1) , 149-159
- https://doi.org/10.1080/00150199708016089
Abstract
Novel high-resolution X-ray diffractometers have been used to investigate a variety of microstructures such as twins, tweed, and domain boundaries in ferroelastic materials. It is shown that copious information can be extracted using our experimental methods. The instruments are equipped with 1D and 2D detectors, where the distance to the sample can be varied to enhance the intrinsic resolution. Both the specimen and the detectors possess several degrees of freedom which include sample tilts and rotations as well as translations. In our contribution we introduce briefly the experimental and theoretical methods connected with this special equipment and describe its application to the characterization of a wide variety of specimens such as single crystals, ceramic materials and thin films.Keywords
This publication has 30 references indexed in Scilit:
- Structural investigations of recently discovered high Tc superconductorsMicroscopy Research and Technique, 1995
- Tweed microstructures: Experimental observations and some theoretical modelsPhase Transitions, 1994
- Three-dimensional structural modulation in doped YBa2Cu3O7-δPhilosophical Magazine A, 1994
- Twin and tweed microstructures in doped by trivalent cationsPhysical Review B, 1993
- Interpretation of tweed contrast from the YBa2Cu3O7-δ systemPhilosophical Magazine A, 1993
- Twin to tweed transition in YBa2Cu3O7–δ by substitution of Al for CuPhysica C: Superconductivity and its Applications, 1992
- Oxygen, diffuse scattering, and tweed structure in the YBa2Cu3O7-δ systemUltramicroscopy, 1991
- Displacement wave of the tweed structure in Y-Ba-Cu-O oxidesPhilosophical Magazine Letters, 1990
- Detwinning mechanism, twinning dislocations and planar defects in YBa2Cu3O7−δPhysica C: Superconductivity and its Applications, 1990
- X-ray scattering from critical fluctuations and domain walls in KDP and DKDPJournal of Physics C: Solid State Physics, 1986