Abstract
Experimental studies of the liquid-solid interface are complicated because the interface is embedded and involves only a small number of atoms relative to the bulk liquid and solid. In his Perspective, [Johnson][1] highlights recent advances toward characterizing the interface. He highlights the report by [ Donnelly et al .][2], who have used transmission electron microscopy (TEM) to study xenon inclusions in aluminum. The report provides evidence for progressive layering in the liquid near the interface, demonstrating the power of well-designed TEM studies to elucidate such interfaces. [1]: http://www.sciencemag.org/cgi/content/full/296/5567/477 [2]: http://www.sciencemag.org/cgi/content/short/296/5567/507