Impact of BIT design parameters on systems RAM
- 1 January 1988
- journal article
- Published by Elsevier in Reliability Engineering & System Safety
- Vol. 23 (3) , 219-246
- https://doi.org/10.1016/0951-8320(88)90111-1
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Built in test — past mistakes, present problems and future solutionsReliability Engineering, 1986
- Design & Evaluation Methodology For Built-In-TestIEEE Transactions on Reliability, 1981