Ionizing Events in Small Device Structures
- 1 December 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 22 (6) , 2543-2548
- https://doi.org/10.1109/tns.1975.4328165
Abstract
A theoretical model is described for calculating the number and average energy of ionizing events produced by x-rays in regions with characteristic dimensions ranging from mm to fractions of a μm. Microdosimetry theory is applied to estimate the variance of the event distribution and it is found that when device dimensions are in the μm range or less the distribution approaches lognormality. The model does not involve extensive calculations and uses only readily available data tabulations. It indicates that dose fluctuations could become significant if present trends towards smaller device elements continue.Keywords
This publication has 9 references indexed in Scilit:
- Ionizing radiation dosimetry and noise in small geometry devicesIEEE Transactions on Nuclear Science, 1974
- Fundamental limitations in microelectronics—I. MOS technologySolid-State Electronics, 1972
- Event Simultaneity in Cavities: Theory of the Distortions of Energy Deposition in Proportional CountersRadiation Research, 1971
- An Analysis of the Target Theory of Lea with Modern DataInternational Journal of Radiation Biology and Related Studies in Physics, Chemistry and Medicine, 1970
- The Energy Loss of Electrons in SolidsRadiation Research, 1964
- Interpretation of Radiation Results Based on Target TheoryRadiation Research, 1957
- Energy Spectrum Resulting from Electron Slowing DownPhysical Review B, 1954
- The mathematical description of certain breakage mechanisms leading to the logarithmico-normal distributionJournal of the Franklin Institute, 1947
- Random AlmsThe Annals of Mathematical Statistics, 1944