Fatigue Behavior of Solders Used in Flip-Chip Technology
- 1 March 1973
- journal article
- Published by ASTM International in Journal of Testing and Evaluation
- Vol. 1 (2) , 170-178
- https://doi.org/10.1520/jte10895j
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Reliability of Controlled Collapse InterconnectionsIBM Journal of Research and Development, 1969
- Fatigue crack formation in bicrystals of leadPhilosophical Magazine, 1966
- Fatigue: A complex subject—Some simple approximationsExperimental Mechanics, 1965
- The effect of cycle frequency and atmospheric corrosion on the fatigue of leadPhilosophical Magazine, 1964
- A New ExperienceThe American Journal of Nursing, 1951