High-temperature, cyclic-loading stage for the scanning electron microscope

• 1 May 1984
• journal article
• Published by AIP Publishing in Review of Scientific Instruments
• Vol. 55  (5) , 778-782
• https://doi.org/10.1063/1.1137816

Abstract

Keywords

• SCANNING ELECTRON MICROSCOPY
• SECONDARY ELECTRON
• HIGH RESOLUTION
• SAMPLE PREPARATION
• SCANNING ELECTRON MICROSCOPE
• ELECTRON MICROSCOPE