Component Vulnerability Analysis of Microcircuits
- 1 January 1970
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 17 (6) , 91-95
- https://doi.org/10.1109/TNS.1970.4325772
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Characterization and Modeling of the 709 Integrated Circuit Operational Amplifier in an Ionizing Radiation EnvironmentIEEE Transactions on Nuclear Science, 1969
- Lumped-Model Analysis of Microcircuit VulnerabilityIEEE Transactions on Nuclear Science, 1968