A technique for suppressing dark current generated by interface states in buried channel CCD imagers

1 July 1980

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters

Vol. 1 (7) , 131-133
https://doi.org/10.1109/EDL.1980.25259

Abstract

A technique for operating buried channel CCD imagers to achieve very low dark current with no loss in optical sensitivity is described. Using this technique on a 4-phase CCD shift register operated in an imaging mode, the dark current is reduced from 7.0 nA/cm²to 0.60 nA/cm²at 295°K.

Keywords

DARK CURRENT
INTERFACE STATES
CHARGE COUPLED DEVICES
SHIFT REGISTERS
TEMPERATURE
ELECTRONS
SUBSTRATES
DOPING
OPTICAL LOSSES
OPTICAL SENSORS

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