High-resolution electron microscopy studies of Nb/Al2O3 interfaces
- 31 July 1990
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 33 (1) , 51-61
- https://doi.org/10.1016/0304-3991(90)90104-t
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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