Simulation of non-ionising energy loss and defect formation in silicon
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- 18 July 2002
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 491 (1-2) , 194-215
- https://doi.org/10.1016/s0168-9002(02)01227-5
Abstract
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