Examination of grain boundaries in polycrystalline solar cells using a scanning optical microscope

3 August 1978

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 14 (16) , 507-508
https://doi.org/10.1049/el:19780340

Abstract

A scanning optical microscope in which the object is scanned mechanically is used to produce images from polycrystalline solar cells using both the reflected-light and photoinduced current modes.

Keywords

REFLECTED LIGHT IMAGES
PHOTOINDUCED CURRENT MODES
GRAIN BOUNDARIES EXAMINATION
POLYCRYSTALLINE SOLAR CELLS
SCANNING OPTICAL MICROSCOPE