The evaluation of thermally stimulated current curves

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Abstract
A method of evaluating experimentally determined thermally stimulated current curves by a process of successive approximation is described. The method is essentially one of curve fitting and an excellent fit is eventually obtained between the theoretical and experimental curves. The process of curve fitting serves to determine the electron-trapping parameters. The technique can be used for the two extreme cases of trap emptying: emptying with no retrapping and emptying with fast retrapping. The technique is illustrated by its application to some experimental results obtained from CdS crystals.