Achievement of ultra-high resolution by 400 kV analytical atomic-resolution electron microscopy
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 18 (1) , 19-31
- https://doi.org/10.1016/0304-3991(85)90118-4
Abstract
No abstract availableKeywords
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- Refinement of the defect structure of `GeNb9O25' by high-resolution electron microscopyActa Crystallographica Section A, 1976
- Erratum: Electron Gun using Long-Life Lanthanum Hexaboride CathodeJournal of Applied Physics, 1967
- Electron Gun using Long-Life Lanthanum Hexaboride CathodeJournal of Applied Physics, 1967