EXAFS and X-ray diffraction of RM2X2 compounds (R = rare earths, M> = transition metal, X = Si, Ge)
- 31 July 1986
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 59 (4) , 241-244
- https://doi.org/10.1016/0038-1098(86)90588-0
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Local environment effects in mixed valent rare-earth systems studied by EXAFSJournal of Magnetism and Magnetic Materials, 1985
- Extended x-ray absorption fine structure—its strengths and limitations as a structural toolReviews of Modern Physics, 1981
- On the detection by EXAFS spectroscopy of multimeric species and of complex anions in diethylether and diethylcarbonateJournal of Solution Chemistry, 1981
- EXAFS measurements on FeB metallic glasses: Asymmetry of the radial distribution functionSolid State Communications, 1981