Interfacial free energies from substrate curvature measurements of the creep of multilayer thin films
- 31 March 1994
- journal article
- Published by Elsevier in Acta Metallurgica et Materialia
- Vol. 42 (3) , 1031-1038
- https://doi.org/10.1016/0956-7151(94)90297-6
Abstract
No abstract availableKeywords
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