Soft x-ray W/Be multilayer and its application to a diffraction grating Yuichi,Utsumi

Abstract
Tungsten/beryllium multilayers were coated onto lamellar diffraction gratings using a neutral atom beam sputtering technique. Boundary roughness of the multilayer was estimated to be 6.0 Å as a standard deviation. Diffraction efficiency of the multilayer‐coated grating was measured using monochromatized synchrotron radiation.

This publication has 6 references indexed in Scilit: