Atomic-Force Microscopy

This publication has 11 references indexed in Scilit:

• Atomic Resolution with Atomic Force Microscope
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• Vacuum Tunneling: A New Technique for Microscopy
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• The Tunneling Microscope: A New Look at the Atomic World
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• Imaging in real time with the tunneling microscope
  Applied Physics Letters, 1986
• Atomic Force Microscope
  Physical Review Letters, 1986
• The role of surface forces in metal–metal contacts
  Journal of Vacuum Science & Technology A, 1985
• Surface roughness measurements of low-scatter mirrors and roughness standards
  Applied Optics, 1984
• Three-dimensional stylus profilometry
  Wear, 1982
• Silicon as a mechanical material
  Proceedings of the IEEE, 1982
• Study of surface topography in impact wear
  Wear, 1982