Electron Capture byTrapped at Very Low Energies
- 12 January 1981
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 46 (2) , 107-110
- https://doi.org/10.1103/physrevlett.46.107
Abstract
An electrostatic ion trap was used to trap ions created by a fast xenon beam passing through neon gas. Exponential decay in time of the fraction due to electron capture from neon gas was observed and the decay rates measured. For mean kinetic energies between 7-45 eV, the total electron-capture cross section () is found to be velocity independent. For this energy range we obtain , with an estimated uncertainty of 30%.
Keywords
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