X-ray emission spectroscopy—part II

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Abstract
Summary of Part II: X-ray emission spectroscopy can detect several elements simultaneously in very low concentrations, and can be applied to many practical problems. Some applications in industry, in sir and water pollution by heavy metals, and in the study of the importance of trace elements in biology and medicine are discussed. The advantages of X-ray emission spectroscopy are: simple sample preparation, the small quantities needed for a sample, and the simultaneous determination of ell medium-heavy and heavy metals concentrations by the detection of their characteristic K and L X-ray lines. Sensitivity, background problems, target preparation, and data reduction are described in some detail. Part I of this article described X-ray production by charged particle and X-ray excitation. Theory and experiments on charged-particle-induced X-ray emission were summarized. Detection of X-rays by semiconductor and other detectors was discussed.