Apparatus for Contactless Measurement of the Photomagnetoelectric Effect
- 1 September 1973
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 44 (9) , 1410-1411
- https://doi.org/10.1063/1.1686403
Abstract
The new apparatus for contactless measurement of the photomagnetoelectric (PME) effect is described and its analysis is carried out. By this technique the contactless measurement of lifetime and surface recombination velocity in semiconductors is made possible.This publication has 2 references indexed in Scilit:
- Theory of the Photomagnetoelectric Effect in SemiconductorsPhysical Review B, 1956
- Photomagnetoelectric Effect in Germanium and SiliconPhysical Review B, 1954