Diffraction study of the influences of bonding type and misorientation angle on the structure of [001] twist boundaries along the direction normal to the interface

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Abstract
The influences of bonding type and misorientation angle on the structure of [001] twist grain boundaries along the direction normal to the interface have been studied using an electron diffraction approach in which ′streaks′ of diffuse scattering are recorded from the grain boundary core region. The boundaries studied were in NiO (with largely ionic bonding), Au (metallic bonding) and Ge (covalent bonding), in some cases with varying misorientation angles. The electron diffraction patterns have been analysed in terms of changes of plane spacing normal to the interface using the theoretical analysis in the preceding paper (Vaudin, Burkel and Sass 1986). Qualitative conclusions are drawn on the influence of bonding type and misorientation angle on the structure of [001] twist grain boundaries. The results are discussed with particular reference to the limitations of the experimental technique, dynamical diffraction effects, grain boundary segregation and reconstruction of the grain boundary core.