Force modulation atomic force microscopy recording for ultrahigh density recording
- 1 July 1997
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 15 (4) , 788-792
- https://doi.org/10.1116/1.589410
Abstract
We propose force modulation atomic force microscopy (FM)-(AFM) pit recording and demonstrate the possibility of achieving ultrahigh density recording with high speed readout. A minimum pit size of around 10 nm in diameter is formed by cold plastic deformation of the polycarbonate disk surface at a force of over 40 nN. Using a prototype of the rotation type FM-AFM pit recording system, an ultrahigh recording density of 1.2 Tb/in.2 and a readout speed of 1.25 Mb/s are demonstrated in 1/2(2,7) code recording.This publication has 11 references indexed in Scilit:
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