Abstract
The uses are discussed of formulas derived by input admittance analysis for the complex permittivity of dielectric samples, placed in a matched coaxial line or terminating it, as a function of the Fourier transforms of the incident and reflected real time pulses observed in time-domain spectroscopy. Precautions to be taken for dielectrics with appreciable ohmic conductance are described, and it is also shown that magnetic permeabilities of linear isotropie materials can be obtained by measurements of open- and short-circuited samples.

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