A comparative Rutherford backscattering spectrometry and Auger electron spectroscopy depth profile study of Fe-N films
- 1 July 1988
- journal article
- research article
- Published by Elsevier in Thin Solid Films
- Vol. 161, L69-L70
- https://doi.org/10.1016/0040-6090(88)90269-6
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Ion-stimulated sorption: An ion-assisted technology with new possibilitiesThin Solid Films, 1986