Probe compensation in thick microstrip patches

Publisher Website
Google Scholar
Abstract
In thick microstrip patches, probe inductance prevents matching of the patch impedance to the input connector. The probe inductance can be tuned out with a capacitive gap. To maintain simplified construction the gap is here etched on the patch surface. Bandwidths equal to or greater than that theoretically predicted are realised. Use of a single probe-compensated feed results in radiation pattern distortion, high crosspolarisation and low efficiency due both to higher-order modes and surface-wave generation. Two-probe feeding is used here to overcome these problems and to give a wide-band antenna with good radiation pattern control and high efficiency.

This publication has 0 references indexed in Scilit: