Accumulation layer profiles at InAs polar surfaces
- 22 December 1997
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 71 (25) , 3688-3690
- https://doi.org/10.1063/1.120482
Abstract
High resolution electron energy loss spectroscopy,dielectric theory simulations, and charge profile calculations have been used to study the accumulation layer and surface plasmon excitations at the In-terminated (001)-(4×1) and (111)A-(2×2) surfaces of InAs. For the (001) surface, the surface state density is 4.0±2.0×10 11 cm −2 , while for the (111)A surface it is 7.5±2.0×10 11 cm −2 , these values being independent of the surface preparation procedure, bulk doping level, and substrate temperature. Changes of the bulk Fermi level with temperature and bulk doping level do, however, alter the position of the surfaceFermi level. Ion bombardment and annealing of the surface affect the accumulation layer only through changes in the effective bulk doping level and the bulk momentum scattering rate, with no discernible changes in the surface charge density.Keywords
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