A residual resistance probe for small metal samples
- 1 June 1981
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 14 (6) , 699-700
- https://doi.org/10.1088/0022-3735/14/6/009
Abstract
A simple spring-loaded, four-contact mount for residual resistance measurements is described. It is suitable for small, rectangular-prism metal samples of the type used in de Haas-van Alphen studies.Keywords
This publication has 1 reference indexed in Scilit:
- The Fermi surface of dilute copper alloys. II. TheoryJournal of Physics F: Metal Physics, 1975