On the use of markers and tracers to establish the growth mechanism of alumina scales during high temperature oxidation
- 1 July 1986
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 9 (3) , 163-168
- https://doi.org/10.1002/sia.740090306
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- The use of a 18O tracer and Rutherford backscattering spectrometry to study the oxidation mechanism of NiAl.Solid State Ionics, 1985
- The Characteristics of Alumina Scales Formed on Fe‐Based Yttria‐Dispersed AlloysJournal of the Electrochemical Society, 1984
- 18O Tracer studies of Al2O3 scale formation on NiCrAl alloysOxidation of Metals, 1982
- Application of auger electron spectroscopy and inert metal marker techniques to determine metal and oxygen transport in oxide films on metalsOxidation of Metals, 1980
- Growth and Microstructure of α ‐ Al2 O 3 on β ‐ NiAlJournal of the Electrochemical Society, 1980
- Improvements in high temperature oxidation resistance by additions of reactive elements or oxide dispersionsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1980
- The Relationship Between Oxide Grain Morphology and Growth Mechanisms for Fe‐Cr‐Al and Fe‐Cr‐Al‐Y AlloysJournal of the Electrochemical Society, 1979
- Application of a nondestructive single-spectrum proton activation technique to study oxygen diffusion in zinc oxideJournal of Applied Physics, 1973
- Mechanism of oxide adherence on Fe-25Cr-4Al (Y or Sc) alloysMetallurgical Transactions, 1972