Characterization of a high temperature superconducting oxide thin-film RF SQUID
- 1 March 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 25 (2) , 1305-1308
- https://doi.org/10.1109/20.92534
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Direct measurement of the superconducting properties of single grain boundaries inPhysical Review Letters, 1988
- Quantum interference devices made from superconducting oxide thin filmsApplied Physics Letters, 1987
- DC SQUIDs 1980: The state of the artIEEE Transactions on Magnetics, 1981
- Noise in the rf SQUIDJournal of Low Temperature Physics, 1975