Ellipsometric Data Analysis of the Oxidation of Thin Molybdenum Films*
- 1 December 1972
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 62 (12) , 1524-1525
- https://doi.org/10.1364/josa.62.001524
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Variation of Concentration with Depth of Absorbed Oxygen in Niobium during OxidationJournal of Applied Physics, 1972
- Interpretation of Ellipsometric Observations of Absorbed Oxygen in Niobium*Journal of the Optical Society of America, 1970
- Interspecimen Comparison of the Refractive Index of Fused Silica*,†Journal of the Optical Society of America, 1965