High-voltage and high-resolution electron microscopy studies of interfaces in zirconia-toughened alumina
- 1 November 1987
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 56 (5) , 595-613
- https://doi.org/10.1080/01418618708204475
Abstract
Employing high-resolution electron microscopy as well as high-voltage electron microscopy, characteristic interface phenomena have been studied in zirconia (ZrO2) toughened alumina (Al2O3). Glassy phases are shown to occur especially in grain triple junctions containing one ZrO2 particle at least. A contribution to better understanding of the microstructure of interfaces between martensitic twins in monoclinic ZrO2 is given. Besides different grain-boundary dislocation reactions between adjacent Al2O3 grains indicating strong plastic deformation processes, regularly spaced misfit dislocations were observed at the interface between intragranular tetragonal ZrO2 and the Al2O3 matrix which possibly influence the transformation behaviour of ZrO2. Finally, amorphization processes in the twin-terminating interface region are discussed as initiating centres for grain-boundary microcracking.Keywords
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