Evaluation of the spatial resolution of a CT scanner by direct analysis of the edge response function

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Abstract
A new approach to the measurement of the spatial resolution of a computed tomography (CT) scanner system is presented. The method is based on a direct least-squares fit of an analytical expression to a set of data obtained from a CT image of the interface between 2 materials. The implementation of the method in connection with the G.E. RTPLAN computer configuration is described. The method was applied in determining the resolution of an EMI-7070 scanner and it is shown that the assumption of uniformity of the system resolution across the CT image is fulfilled within the accuracy of the present method. The reproducibility of the method was estimated from a series of spatial resolution determinations performed on 10 images taken with identical scan parameters. The SD of this series was 3.2%.

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