Correction terms for contacts to diffused resistors

1 June 1970

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 17 (6) , 484-485
https://doi.org/10.1109/t-ed.1970.17016

Abstract

Correction terms obtained from measurements on typical planar resistors are given and compared to values expected from two different mechanisms: inhomogeneous current flow around the contact or contact resistance between metal and diffusion layer. Good agreement between contact resistance model and experiment is shown.

Keywords

RESISTORS
DIODES
THERMAL RESISTANCE
CONTACT RESISTANCE
GEOMETRY
ELECTRIC RESISTANCE
RADIO FREQUENCY
OSCILLATORS
CAPACITANCE